The Park FX40 Automatic Atomic Force Microscope (AFM) System is capable of high spatial resolution surface mapping and is equipped with a True Non-Contact TM mode capable of nanoscale surface analysis ...

The discovery from the Trinity nuclear test site shows how extreme conditions can result in materials never before seen in nature or in the lab. The term “clathrates” denotes materials characterized ...

Direct visualization of carbon corrosion in liquid uncovers the dynamics of carbon degradation during oxidation. Carbon materials underpin technologies ranging from energy storage to sensing, yet ...

Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force microscope, then we look at a real AFM (an nGauge AFM from ICSPI) and do a few ...

As of early 2026, the global AFM market has expanded to approximately USD 542 million, up from USD 514 million in 2024, reflecting increased demand from semiconductor fabrication, nanotechnology ...

The integrated workflow combines glovebox sample preparation, liquid-nitrogen cold-chain transfer, and Cs-corrected cryo-TEM imaging, enabling continuous protection of air-sensitive materials from ...

On Feb. 28, the United States and Israel launched coordinated but separately named military campaigns against Iran — the United States under Operation Epic Fury and Israel under Operation Roaring Lion ...

Physically magnifying objects using a key moisture-absorbing ingredient in diapers has opened an unprecedented view of the microbial world. When you slip a slide under a microscope, a system of glass ...

Microscopy is an imaging technique that enables us to see a world that would otherwise be invisible to us. Once upon a time, visualizing cells, microbes and other entities not perceptible to the naked ...

A pandemic-era breakthrough has allowed scientists to literally expand our view of plankton. By using ultrastructure expansion microscopy, researchers visualized the inner workings of hundreds of ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...